Structural and Optical Properties of Tungsten Oxide Thin Film Prepared Using Electrochemical Method with Water and Ethanol Solution

Abstract

In this paper, structural and optical properties of high purity and well crystallized tungsten oxide (WO3) thin film deposited on glass substrate by electrochemical method with water and ethanol with different of annealing temperature 400,500 and 600 oC for 60 min have been characterized using XRD analysis, SEM, and EDX, and UV-Vis spectroscopies, respectively. Prepared WO3 thin films have hexagonal structure and polycrystalline in nature. It clear that the diffraction peaks of WO3 thin films prepared using electrochemical method with water solution on glass substrate were at 2ϑ =31.75 corresponding to the orientation of (101) at 400 oC annealing temperature, and at 2ϑ =31.85, 66.35 corresponding to the orientation of (101) and (-231) respectively, at 500 oC annealing temperature, at 2ϑ =31.75 corresponding to the orientation of (101) at 600 oC annealing temperature, these peaks agree with (JCPDS-30-1387). While,  the diffraction peaks of WO3 thin films prepared using electrochemical method with ethanol solution on glass substrate were at at 2ϑ =31.75 corresponding to the orientation of (101) at 400 oC annealing temperature ,and at  2ϑ =31.65, 66.25 corresponding to the orientation of (101) and (-231) respectively, at 500 oC annealing temperature, at 2ϑ =31.85corresponding to the orientation of (101) at 600 oC annealing temperature  these peaks agree with (JCPDS-30-1387). In addition, narrow FWHM, small crystal and low strain have been calculated and obtained for film with water solution.