SURFACE STRUCTURE STUDY OF COMPOSITE MATERIALS HDPE/ TlIn0.98Gd0.02Se2 USING SCANNING PROBE MICROSCOPY

Abstract

Background: In this work, an atomic force microscopy (AFM) study of the microrelief of the surface of composite materials HDPE + xvl% TlIn0.98Gd0.02Se2  was carried out, by reading the forces of interatomic interaction between probe atoms and sample atoms. It is shown that the introduction of fillers into the composition of the polymer matrix that can change the properties of the resulting composite in a direction can affect the thermal stability, optical, physical-mechanical, electrical, barrier properties, as well as resistance to various types of radiation. Materials and Method: The aim of this work was to study the surface morphology of composite materials based on high-density polyethylene containing the semiconductor material TlIn0.98Gd0.02Se2 in various percentages using atomic force microscopy (AFM) methods. Results: Scanning the surface of samples in the phase control mode makes it possible, from the analysis of changes in the phase shift of the amplitude-frequency characteristic of the cantilever, to reveal the difference in the volumetric compositions of the surface of composite films caused by the adhesive interaction between the probe and the surface. Fourier spectroscopy was used to study the distribution of filler particles in films of polymer composites, as well as their boundary layer. Three-dimensional images of the surface and distribution curves of elements of surface images by size - histograms are obtained. The study was conducted without mechanical treatment. Conclusion: Due to the unique electrophysical, optical, magnetic, electrochemical properties and the study of the microrelief of the surface of films, these composites are promising materials for creating various devices of the element base of modern molecular electronics, light-emitting diodes, photosensitive cells, electrochemical sensors.